The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2021
Filed:
Dec. 27, 2016
Applicant:
Microvision, Inc., Redmond, WA (US);
Inventors:
Patrick J. McVittie, Seattle, WA (US);
P. Selvan Viswanathan, Belleuve, WA (US);
Jonathan A. Morarity, Seattle, WA (US);
Assignee:
Microvision, Inc., Redmond, WA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/46 (2006.01); G06F 3/041 (2006.01); G06F 3/01 (2006.01); G06F 3/042 (2006.01);
U.S. Cl.
CPC ...
G01S 17/46 (2013.01); G06F 3/017 (2013.01); G06F 3/0418 (2013.01); G06F 3/0423 (2013.01); G06F 3/0426 (2013.01); G06F 2203/04101 (2013.01);
Abstract
A projection system emits light pulses in a field of view and measures properties of reflections. Properties may include time of flight and return amplitude. Foreground objects and background surfaces are distinguished, distances between foreground objects and background surfaces are determined based on reflections that are occluded by the foreground objects and other properties of the projection system.