The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2021
Filed:
Aug. 22, 2019
Chiun Mai Communication Systems, Inc., New Taipei, TW;
Kwo-Jyr Wong, New Taipei, TW;
Chiun Mai Communication Systems, Inc., New Taipei, TW;
Abstract
A measurement method for measuring millimeter wave (mm-wave) signal and device using the method includes a first measuring device receiving a mm-wave signal by an array antenna at a first angle of arrival corresponding to a position of the first measuring device, the mm-wave signal being sent by a second measuring device at a first angle of departure. Thereby, a downlink between the first measuring device and the second measuring device can be established quickly. From a certain ascertainable location, the first measurement device sends the mm-wave signal by the array antenna at a second angle of departure, and the second measurement device receives the mm-wave signal at a second angle of arrival corresponding to the position of the first measuring device, thus, an uplink between the first measuring device and the second measuring device can be established quickly.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile