The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2021
Filed:
Oct. 20, 2018
Wuhan University, Hubei, CN;
WUHAN UNIVERSITY, Hubei, CN;
Abstract
An analog circuit fault feature extraction method based on a parameter random distribution neighbor embedding winner-take-all method, comprising the following steps: (1) collecting a time-domain response signal of an analog circuit under test, wherein the input of the analog circuit under test is excited by using a pulse signal, a voltage signal is sampled at an output end, and the collected time-domain response signal is an output voltage signal of the analog circuit; (2) applying a discrete wavelet packet transform for the collected time-domain response signal to acquire each wavelet node signal; (3) calculating energy values and kurtosis values of the acquired wavelet node signals to form an initial fault feature data set of the analog circuit; and (4) analyzing the initial fault feature data by the parameter random distribution neighbor embedding winner-take-all method, to acquire optimum low-dimensional feature data. The invention effectively reduces redundancy and interference elements in the fault features, and greatly improves degree of separation of different fault features and degree of polymerization of samples of same fault category.