The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2021

Filed:

Jul. 07, 2014
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Takahiro Toizumi, Tokyo, JP;

Eisuke Saneyoshi, Tokyo, JP;

Koji Kudo, Tokyo, JP;

Hitoshi Yano, Tokyo, JP;

Ryo Hashimoto, Tokyo, JP;

Yuma Iwasaki, Tokyo, JP;

Hisato Sakuma, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 21/00 (2006.01); G06Q 50/06 (2012.01);
U.S. Cl.
CPC ...
G01R 21/00 (2013.01); G06Q 50/06 (2013.01); Y04S 20/242 (2013.01); Y04S 50/10 (2013.01);
Abstract

Provided is a monitoring apparatus including an acquisition unit that acquires first time-series data which is time-series data of a measured value and/or a feature amount regarding an electrical device group, and a registration and updating unit that, when a difference in values between a pre-state-change data value which is any one of a data value at a first point in time in the first time-series data and a statistic of a plurality of data values from a point in time earlier than the first point in time by a predetermined period of time to the first point in time and a post-state-change data value which is any one of a data value at a second point in time later than the first point in time and a statistic of a plurality of data values from the second point in time to a point in time later than the second point in time by a predetermined period of time satisfies a predetermined condition, stores a feature amount extracted from any waveform data of a total current consumption, a total power consumption, and a total input voltage of the electrical device group corresponding to the pre-state-change data value and the post-state-change data value which satisfy the predetermined condition, in a feature amount storage unit.


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