The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2021

Filed:

Feb. 26, 2019
Applicant:

Honeywell International Inc., Morris Plains, NJ (US);

Inventors:

Supriya Rawat, Hyderabad, IN;

Sharad Gitaram Pathare, Ahmednagar, IN;

Sarabjit Singh, Hyderabad, IN;

Anant Vitthal Vidwans, Hyderabad, IN;

Assignee:

Honeywell International Inc., Morris Plains, NJ (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 15/14 (2006.01); G01R 19/00 (2006.01); G01R 19/25 (2006.01);
U.S. Cl.
CPC ...
G01R 15/148 (2013.01); G01R 19/0023 (2013.01); G01R 19/2513 (2013.01);
Abstract

A method includes obtaining different measurements of voltages across terminals of a field device coupled to an I/O loop. The voltage measurements are associated with corresponding loop currents flowing through the I/O loop. The method also includes identifying a baseline loop resistance measurement of the I/O loop using the voltage measurements and the loop currents. The method further includes obtaining additional measurements of voltages across the terminals of the field device. The additional voltage measurements are associated with additional corresponding loop currents flowing through the I/O loop. The method also includes identifying additional loop resistance measurements of the I/O loop using the additional voltage measurements and the additional loop currents. In addition, the method includes detecting a problem with the I/O loop based on the baseline loop resistance measurement and the additional loop resistance measurements.


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