The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2021

Filed:

Aug. 21, 2018
Applicant:

Roche Diagnostics Operations, Inc., Indianapolis, IN (US);

Inventors:

Kai Hebestreit, Heidelberg, DE;

Sylvia Saecker, Mannheim, DE;

Klaus Thome, St. Leon-Rot, DE;

Werner Heidt, Darmstadt, DE;

Assignee:

Roche Diagnostics Operations, Inc., Indianapolis, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/487 (2006.01); A61B 5/145 (2006.01); G01N 27/327 (2006.01); A61B 5/1477 (2006.01);
U.S. Cl.
CPC ...
G01N 33/4875 (2013.01); A61B 5/1477 (2013.01); A61B 5/14532 (2013.01); G01N 27/3273 (2013.01); A61B 2562/0295 (2013.01);
Abstract

A test element analysis system for an analytical examination of a sample, in particular of a body fluid, is disclosed. The test element analysis system comprises an evaluation device with a test element holder for positioning a test element containing the sample and a measuring device for measuring a change in a measuring zone of the test element, the change being characteristic for an analyte. The test element holder contains contact elements with contact surfaces which allow an electrical contact between contact surfaces of the test element and the contact surfaces of the test element holder. The contact surfaces of the contact elements of the test element holder are provided with an electrically conductive surface containing metallic ruthenium.


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