The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2021

Filed:

May. 05, 2016
Applicant:

University of Science and Technology of China, Hefei, CN;

Inventors:

Xing Rong, Hefei, CN;

Zhifu Shi, Hefei, CN;

Xi Qin, Hefei, CN;

Yijin Xie, Hefei, CN;

Lin Wang, Hefei, CN;

Zhen Jiang, Hefei, CN;

Jiangfeng Du, Hefei, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 24/10 (2006.01); G01R 33/60 (2006.01);
U.S. Cl.
CPC ...
G01N 24/10 (2013.01); G01R 33/60 (2013.01);
Abstract

A magnetic resonance spectrometer and a control apparatus for the magnetic resonance spectrometer based on an FPGA. The control apparatus includes a control unit and a conversion receiving unit. The control unit includes a clock source. A waveform generation unit and a signal receiving unit inside the control apparatus are synchronized by means of the same clock source. The control apparatus includes two working modes: a continuous wave mode and an impulse wave mode. The control apparatus can output a microwave signal which is modulated by any wave and has higher synchronism and time resolution.


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