The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2021

Filed:

Jul. 03, 2017
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Takuma Niizaka, Kyoto, JP;

Yasuyuki Keyaki, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01); G01N 23/046 (2018.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G01N 2223/401 (2013.01);
Abstract

Between an X-ray source and a rotating stage, a marker member including a flat plateformed with markers M and a support partsupporting the flat plateis arranged. The formation positions of the markers M on the flat plateare set to positions that allow the distance between the markers M to be most separated in an area in which both of the markers M are not superimposed on a projection image of a subject within the detection range of an X-ray detectorand that is constantly included within the detection range even when an X-ray focal point is moved. Also, the length of the support partis adjusted to a length resulting in a side end of the detection range of the X-ray detector where the flat plateand the markers M are not superimposed on the subject W on a projection image.


Find Patent Forward Citations

Niizaka, Takuma. (2021). X-ray ct device (U.S. Patent No. 11002690). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11002690

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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