The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2021
Filed:
Aug. 15, 2017
Hkc Corporation Limited, Shenzhen, CN;
Chongqing Hkc Optoelectronics Technology Co., Ltd., Chongqing, CN;
Chung-Kuang Chien, Chongqing, CN;
HKC Corporation Limited, Shenzhen, CN;
Chongqing HKC Optoelectronics Technology Co., Ltd., Chongqing, CN;
Abstract
A device for testing impact resistance includes: a shrink film supporting member, disposed on a horizontal platform, and including a main body, a supporting part, and fixing parts disposed on a sidewall of the main body, the supporting part is configured to support a tested shrink film, the plurality of fixing parts is sequentially disposed in parallel at positions of different heights on the sidewall of the main body, and the fixing parts disposed at the positions of different heights represent different impact resistance levels; a level plate, detachably fixed inside the main body by means of any one of the plurality of fixing parts; and an impact member, configured to move downward from a position above a geometric center of the supporting part at a preset speed to exert a frontal impact on the shrink film supported on the supporting part.