The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2021
Filed:
Feb. 04, 2019
Shimadzu Corporation, Kyoto, JP;
Masato Watanabe, Kyoto, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
The purpose is to reduce the influence on the measurement due to high order diffracted light without arranging a filter for removing high order diffracted light between a diffraction grating and a PDA. The correction method includes a correction coefficient determination step of determining a correction coefficient related to a ratio of a portion of a detection signal value to the detection signal value, the portion of the detection signal value being derived from a second order diffracted light of light in the first wavelength range contained in the detection signal value of a long wavelength side photodiode for detecting light in the second wavelength range in the photodiode array, and a correction unit configured to obtain a corrected detection signal value derived from light in the second wavelength range from a different detection signal value of the long wavelength side photodiode by using the correction coefficient determined by the correction coefficient determination step.