The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2021
Filed:
Feb. 01, 2018
Applicant:
Nanophoton Corporation, Osaka, JP;
Inventor:
Katsumasa Fujita, Suita, JP;
Assignee:
NANOPHOTON CORPORATION, Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/04 (2006.01); G01J 3/28 (2006.01); G01J 3/36 (2006.01); G01J 3/44 (2006.01); G01N 21/27 (2006.01); G01N 21/65 (2006.01); G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
G01J 3/04 (2013.01); G01J 3/2803 (2013.01); G01J 3/36 (2013.01); G01J 3/44 (2013.01); G01N 21/27 (2013.01); G01N 21/65 (2013.01); G02B 21/06 (2013.01);
Abstract
A spectroscopic microscope according to the present embodiment includes a light source that generates laser light that enters a sample, a multi-slit part having a plurality of slits through which signal light branched by the edge filter passes, the slits being arranged in the slit width direction, and a spectrometer that disperses the signal light having passed through the slits in the dispersion direction intersecting the slit length direction and detects the signal light with a two-dimensional array photodetector.