The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2021
Filed:
Nov. 18, 2016
Sentek Instrument, Llc, Blacksburg, VA (US);
Lingmei MA, Blacksburg, VA (US);
BO Dong, Blacksburg, VA (US);
Anbo Wang, Blacksburg, VA (US);
Sentek Instrument, LLC, Blacksburg, VA (US);
Abstract
Forming a light pulse having a plurality of time-dependent frequency components such as a chirped light pulse or a light pulse group and superposing reflected light from different portions of an optical fiber allows detection of changes in effective optical path differences due to physical parameters in the environment of the optical fiber by sensing the optical interference pattern of each light frequency and wavelength. The development of a plurality of interference patterns from each light pulse provides sufficient information for robust demodulation by known methods to produce signals having good fidelity to variations in the physical parameters of interest, particularly vibrations and acoustic waves. The location of the measured physical parameter along the optical fiber can be determined from the time difference between injecting the light pulse and detection of a reflection or Rayleigh backscattering and diffraction index of the optical fiber.