The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2021

Filed:

Oct. 18, 2018
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Kazuya Nobayashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); H04N 5/357 (2011.01); H04N 5/225 (2006.01); G03B 35/10 (2021.01);
U.S. Cl.
CPC ...
G01C 3/085 (2013.01); G03B 35/10 (2013.01); H04N 5/2254 (2013.01); H04N 5/3572 (2013.01);
Abstract

A distance measurement device includes a first acquisition unit configured to acquire distance information on the basis of a plurality of images captured at different viewpoints, a second acquisition configured to acquire correction information of the distance information on the basis of a plurality of images captured at a timing different from the plurality of images used by the first acquisition unit, and a correction unit configured to correct the distance information on the basis of the correction information.


Find Patent Forward Citations

Nobayashi, Kazuya. (2021). Device, method, and medium for measuring distance information using a parallax calculated from multi-viewpoint images (U.S. Patent No. 11002538). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11002538

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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