The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2021
Filed:
Sep. 30, 2016
The Mitre Corporation, McLean, VA (US);
Michael Heath Farris, Vienna, VA (US);
Andrew Roger Scott, McLean, VA (US);
Pamela Ann Texter, Naples, FL (US);
The MITRE Corporation, McLean, VA (US);
Abstract
Techniques are provided for locating and validating single-nucleotide polymorphism (SNP) islands by scanning a reference genome. A system scans a reference genome to locate a high-variance region containing at least a minimum number of known impactful SNP locations in less than a maximum length, wherein the high-variance region is flanked by low-variance regions of at least minimum length and each having fewer than a maximum number of known relevant SNP locations. The system allows for tuning maximum and minimum region lengths, maximum and minimum SNP-location quantities, and rate-of-occurrence thresholds that define relevant and/or impactful SNP locations. Primers are designed for portions of the low-variance regions that are unique within the reference genome, wherein the primers amplify for the high-variance region. The primers are used to amplify genetic material samples in order to perform analyses to distinguish sample identity and/or to determine whether a sample corresponds to single or multiple contributors.