The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2021

Filed:

Feb. 13, 2020
Applicant:

Skc Solmics Co., Ltd., Gyeonggi-do, KR;

Inventors:

Sunghoon Yun, Gyeonggi-do, KR;

Hye Young Heo, Gyeonggi-do, KR;

Jong Wook Yun, Gyeonggi-do, KR;

Jang Won Seo, Gyeonggi-do, KR;

Jaein Ahn, Gyeonggi-do, KR;

Assignee:

SKC solmics Co., Ltd., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 37/22 (2012.01); B24B 37/24 (2012.01); B24B 7/22 (2006.01); B24D 3/00 (2006.01); B24D 11/00 (2006.01); H01L 21/321 (2006.01); B24B 37/20 (2012.01);
U.S. Cl.
CPC ...
B24B 37/22 (2013.01); B24B 7/22 (2013.01); B24B 7/228 (2013.01); B24B 37/20 (2013.01); B24B 37/24 (2013.01); B24B 37/245 (2013.01); B24D 3/00 (2013.01); B24D 11/00 (2013.01); H01L 21/3212 (2013.01);
Abstract

The present invention relates to a polishing pad that minimizes the occurrence of defects and a process for preparing the same, Since the polishing pad comprises fine hollow particles having shells, the glass transition temperature (Tg) of which is adjusted, the hardness of the shells and the shape of micropores on the surface of a polishing layer are controlled. Since the content of Si in the polishing layer is adjusted, it is possible to prevent the surface damage of a semiconductor substrate caused by hard additives. As a result, the polishing pad can provide a high polishing rate while minimizing the occurrence of defects such as scratches on the surface of a semiconductor substrate during the CMP process.


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