The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2021
Filed:
Mar. 22, 2017
Washington State University, Pullman, WA (US);
Lei LI, Pullman, WA (US);
Li-ju Wang, Pullman, WA (US);
Rongrong Sun, Shrewsbury, MA (US);
Yu-chung Chang, Pullman, WA (US);
Lei Li, Pullman, WA (US);
Li-Ju Wang, Pullman, WA (US);
Rongrong Sun, Shrewsbury, MA (US);
Yu-Chung Chang, Pullman, WA (US);
Washington State University, Pullman, WA (US);
Abstract
The methods and configurations herein provide for analysis of microplate based assays. Certain aspects include: an optical illumination panel; a plurality of sample wells configured to receive light from the optical illumination panel, and wherein the plurality of sample wells is configured with a first field of view; at least one aperture array configured to isolate directed light therethrough the plurality of sample wells; at least one optical array configured to receive optical information from the plurality of sample platforms, wherein the at least optical array comprises an array of individual microprisms configured with equal apex angles at distal equidistances along a row, wherein the individual microprism apex angles decrease toward the center of the row culminating in at least one flat surface along a center portion of the row; and a detector configured to capture the optical information with a second field of view as provided by the at least one optical array.