X-ray detector for grating-based phase-contrast imaging

Abstract

An X-ray detector () for a phase contrast imaging system () and a phase contrast imaging system () with such detector () are provided. The X-ray detector () comprises a scintillation device () and a photodetector () with a plurality of photosensitive pixels () optically coupled to the scintillation device (), wherein the X-ray detector () comprises a primary axis () parallel to a surface normal vector of the scintillation device (), and wherein the scintillation device () comprises a wafer substrate () having a plurality of grooves (), which are spaced apart from each other. Each of the grooves () extends to a depth () along a first direction () from a first side () of the scintillation device () into the wafer substrate (), wherein each of the grooves () is at least partially filled with a scintillation material. Therein, the first direction () of at least a part of the plurality of grooves () is different from the primary axis (), such that at least a part of the plurality grooves () is tilted with respect to the primary axis (). An angle between the first direction () of a groove () arranged in a center region () of the scintillation device () and the primary axis () is smaller than an angle between the first direction () of a groove () arranged in an outer region () of the scintillation device () and the primary axis ().