The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2021

Filed:

Nov. 12, 2019
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Yasunobu Kishine, Saitama, JP;

Yosuke Naruse, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); G02B 5/18 (2006.01); G02B 3/08 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2254 (2013.01); G02B 3/08 (2013.01); G02B 5/1876 (2013.01); H04N 5/232 (2013.01);
Abstract

An image processing apparatus according to one aspect of the present invention includes a projected image input unit that inputs a projected image formed by light incident on a Fresnel zone plate from a subject, a complex image generation unit that generates a complex image including an image of a real part and an image of an imaginary part by multiplying the projected image with each of a first Fresnel zone pattern and a second Fresnel zone pattern having the same local spatial frequency in each region and a different phase of the local spatial frequency with respect to the first Fresnel zone pattern, and a Fourier transformation unit that reconstructs an image of a spatial domain by performing two-dimensional complex Fourier transformation on the complex image.


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