The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2021
Filed:
Feb. 13, 2020
Applicant:
Datamax-o'neil Corporation, Altamonte Springs, FL (US);
Inventors:
Sebastien d'Armancourt, Singapore, SG;
Thomas Axel Jonas Celinder, Singapore, SG;
H Sprague Ackley, Seattle, WA (US);
Glenn David Aspenns, Cincinnati, OH (US);
Assignee:
DATAMAX-O'NEIL CORPORATION, Altamonte Springs, FL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01); G06K 5/02 (2006.01); G06T 7/00 (2017.01); G06T 7/254 (2017.01);
U.S. Cl.
CPC ...
H04N 1/00737 (2013.01); G06K 5/02 (2013.01); G06T 7/001 (2013.01); G06T 7/0002 (2013.01); G06T 7/254 (2017.01); H04N 1/00005 (2013.01); H04N 1/00015 (2013.01); H04N 1/00029 (2013.01); H04N 1/00037 (2013.01); H04N 1/00039 (2013.01); H04N 1/00045 (2013.01); H04N 1/00082 (2013.01); G06T 2207/30144 (2013.01);
Abstract
A method for printing defect detection includes processing and analyzing a difference image obtained by comparing an image scanned with a verifier to a reference image. The detected defects are grouped, and the grouping is refined. Confidence level values are then assigned to the refined groups, and analysis is performed to determine if one or more servicing actions should be taken.