The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2021
Filed:
Jun. 04, 2020
Konica Minolta Inc., Tokyo, JP;
Akira Yamamura, Toyokawa, JP;
KONICA MINOLTA, INC., Tokyo, JP;
Abstract
An image inspection apparatus includes: an illumination part that emits light on an inspection target; a reading part that is arranged with, in one or more dimensions, elements that detect light reflected by the inspection target, the reading part reading an entire width of the inspection target; and a hardware processor that inspects a characteristic of the inspection target, wherein a light guide member is provided at a position where light regularly reflected by the inspection target passes, the light guide member is arranged to allow an optical path of light incident on the reading part via the light guide member to be parallel to an optical path of light incident on the reading part without via the light guide member, and the hardware processor inspects a gloss distribution of the inspection target, and inspects a density distribution of the inspection target.