The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2021
Filed:
Nov. 20, 2019
Applicant:
Birad—research & Development Company Ltd., Ramat Gan, IL;
Inventors:
Assignee:
Birad—Research & Development Corapany Ltd., Ramat Gan, IL;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/32 (2006.01); H03K 19/003 (2006.01); G11C 11/417 (2006.01); G06F 21/72 (2013.01); G11C 11/412 (2006.01);
U.S. Cl.
CPC ...
H04L 9/3278 (2013.01); G06F 21/72 (2013.01); G11C 11/412 (2013.01); G11C 11/417 (2013.01); H03K 19/003 (2013.01); H04L 2209/12 (2013.01);
Abstract
A method for detecting unreliable bits in transistor circuitry includes applying a controllable physical parameter to a transistor circuitry, thereby causing a variation in a digital code of a cryptologic element in the transistor circuitry, the variation being a tilt or bias in a positive or negative direction. An amount of variation in the digital code of the cryptologic element is determined. Unreliable bits in the transistor circuitry are defined as those bits for which the variation is in a range defined as unreliable.