The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2021
Filed:
Sep. 16, 2019
Huawei Technologies Co., Ltd., Shenzhen, CN;
Alexis Decurninge, Boulogne Billancourt, FR;
Maxime Guillaud, Boulogne Billancourt, FR;
Xiwen Jiang, Biot Sophia Antipolis, FR;
Florian Kaltenberger, Biot Sophia Antipolis, FR;
Huawei Technologies Co., Ltd., Shenzhen, CN;
Abstract
Intra-array pilot measurements are performed with an antenna array of a MIMO transceiver. The antenna array comprises N transceive antennas. The antenna array is partitioned into K groups of antennas, G, k=1, . . . , K, wherein K≥2, each group Gcomprising Nantennas, A, i=1, . . . , N, of the antenna array. For each k=1, . . . , K, Spilot measurements, M, s=1, . . . , S, are performed, wherein S≥1 and wherein each pilot measurement Mcomprises transmitting simultaneously by each antenna A, i=1, . . . , N, of the group Ga pilot signal Pand generating by each antenna A, i'=1, . . . , N, of the other groups, G, k′≠k, a received signal Yby receiving the pilot signals Ptransmitted by the antennas A, i=1, . . . , N. The measurements can be performed in a mode for detecting whether current hardware impairment parameters are valid or in a mode for updating the hardware impairment parameters.