The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2021
Filed:
Feb. 28, 2020
Applicant:
University of South Florida, Tampa, FL (US);
Inventor:
Zhimin Shi, Tampa, FL (US);
Assignee:
University of South Florida, Tampa, FL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/556 (2013.01); H04B 10/70 (2013.01);
U.S. Cl.
CPC ...
H04B 10/556 (2013.01); H04B 10/70 (2013.01);
Abstract
An apparatus measures the transverse profile of vectorial optical field beams, including at least the directional intensity complex amplitude and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.