The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2021

Filed:

Apr. 04, 2018
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Kenji Yoshida, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B29C 71/04 (2006.01); H01L 21/027 (2006.01); B29C 59/02 (2006.01); G02B 26/10 (2006.01); G03F 7/00 (2006.01); B81C 1/00 (2006.01); B29K 101/00 (2006.01); B29K 105/24 (2006.01); H01L 21/308 (2006.01); H01L 21/266 (2006.01); B29L 9/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/0273 (2013.01); B29C 59/022 (2013.01); B29C 71/04 (2013.01); G02B 26/105 (2013.01); G03F 7/0002 (2013.01); B29C 2059/023 (2013.01); B29K 2101/00 (2013.01); B29K 2105/246 (2013.01); B29L 2009/005 (2013.01); B81C 1/0046 (2013.01); H01L 21/266 (2013.01); H01L 21/308 (2013.01);
Abstract

The present invention provides an imprint apparatus that performs an imprint process of forming a pattern of an imprint material on a processing target region on a substrate by using a mold, including a digital mirror device including two-dimensionally arrayed mirror elements and configured to irradiate the substrate with light reflected by the mirror elements, a measurement unit configured to measure, for each of a plurality of segments obtained by dividing a region in which the mirror elements are arrayed so as to include a plurality of the mirror elements, a light amount of light emitted from each segment, and a control unit configured to control the mirror elements included in each segment based on a measurement result of the measurement unit.


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