The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2021

Filed:

Jan. 03, 2018
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventors:

Jun Cheol Shin, Asan-si, KR;

Won Jang Ki, Yongin-si, KR;

Mi Jung Kim, Cheonan-si, KR;

Sang Cheon Han, Cheonan-si, KR;

Assignee:

Samsung Display Co., Ltd., Yongin-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 3/00 (2006.01); H01L 51/00 (2006.01); H01L 27/32 (2006.01); G09F 9/30 (2006.01); H04N 17/00 (2006.01); G09G 3/3233 (2016.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G09G 3/3233 (2013.01); H01L 27/3225 (2013.01); H01L 27/3276 (2013.01); H01L 51/0031 (2013.01); H01L 51/0097 (2013.01); H04N 17/004 (2013.01); G09F 9/301 (2013.01); G09G 2300/0426 (2013.01); G09G 2300/0861 (2013.01); G09G 2310/0251 (2013.01); G09G 2310/0262 (2013.01); G09G 2330/12 (2013.01); H01L 27/3288 (2013.01); H01L 2251/5338 (2013.01);
Abstract

A display device includes a base substrate which includes a display area and a peripheral area, the peripheral area including a bending area; a first test signal line and a second test signal line which are located on the peripheral area; a lower insulating layer which is located on the first test signal line and the second test signal line; a first test connection pattern which is located on the lower insulating layer and connected to the first test signal line; a second test connection pattern which is located on the lower insulating layer, spaced apart from the first test connection pattern, and connected to the second test signal line; an upper insulating layer; and a first crack detection line which is located on the upper insulating layer, is connected to the first and second test connection patterns, and has at least a portion overlapping the bending area.


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