The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2021

Filed:

Apr. 11, 2019
Applicant:

Honda Motor Co., Ltd., Tokyo, JP;

Inventors:

Kun He, Kirkland, WA (US);

Yan Lu, Newark, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G06N 3/08 (2006.01); G06F 16/55 (2019.01); G06T 3/00 (2006.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06T 7/74 (2017.01); G06F 16/55 (2019.01); G06K 9/4609 (2013.01); G06K 9/6257 (2013.01); G06N 3/08 (2013.01); G06T 3/0056 (2013.01);
Abstract

Feature descriptor matching described herein may include receiving a first input image and a second input image. A feature detector may detect features from the first and second input images. A descriptor extractor may learn local feature descriptors from the features of the first and second input images based on a feature descriptor matching model trained using a ground truth data set. The descriptor extractor may determine a listwise mean average precision (mAP) rank of a pool of candidate image patches from the second input image with respect to a queried image patch from the first input image based on the feature descriptor matching model, the first set of local feature descriptors, and the second set of local feature descriptors. The descriptor matcher may generate a geometric transformation between the first input image and the second input image based on the listwise mAP and a convolutional neural network.


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