The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2021
Filed:
Nov. 28, 2017
Applicant:
Omron Corporation, Kyoto, JP;
Inventors:
Yasuhiro Ohnishi, Kyotanabe, JP;
Takashi Shimizu, Kyoto, JP;
Assignee:
OMRON Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/521 (2017.01); G01B 11/16 (2006.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G06T 7/521 (2017.01); G01B 11/167 (2013.01); G01B 11/25 (2013.01); G06T 2207/10152 (2013.01);
Abstract
A control device acquires a plurality of observation signals observed using a plurality of projection patterns having different spatial frequencies, as observation signals for a measurement point on a measurement object. The control device repeatedly executes processing for estimating two component signals included in each observation signal, so as to separate the observation signal into two component signals, and calculate a three-dimensional position of the measurement point based on the phases of the separated component signals.