The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2021
Filed:
Mar. 06, 2019
Fujitsu Limited, Kawasaki, JP;
Atsunori Moteki, Chofu, JP;
Toshiyuki Yoshitake, Kawasaki, JP;
Ayu Karasudani, Yamato, JP;
Mitsuhiro Makita, Sagamihara, JP;
FUJITSU PATENT CENTER, Kawasaki, JP;
Abstract
An inspection apparatus includes a memory for storing shape information including a plurality of line segments representing a shape of an object; and a processor coupled to the memory and the processor that detects a plurality of feature lines from an image of the object, generates a plurality of combinations obtained by correlating each of the plurality of line segments and each of the plurality of feature lines with each other, generates a plurality of projection lines by projecting each of the plurality of line segments onto the image, sets a threshold value with respect to an error between a position of the projection lines and a position of the feature lines of the line segments included in each of the plurality of combinations based on a statistical value of the error, and classifies the plurality of combinations using the threshold value.