The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2021

Filed:

Jan. 30, 2018
Applicant:

The Dun and Bradstreet Corporation, Short Hills, NJ (US);

Inventor:

Diwakar Ray Govindugari, Summit, NJ (US);

Assignee:

THE DUN AND BRADSTREET CORPORATION, Short Hills, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01); G06F 9/451 (2018.01); G06T 11/20 (2006.01); G06F 16/25 (2019.01); G06F 16/22 (2019.01);
U.S. Cl.
CPC ...
G06Q 10/063 (2013.01); G06F 9/451 (2018.02); G06F 16/2219 (2019.01); G06F 16/252 (2019.01); G06T 11/206 (2013.01);
Abstract

A system for assessing and optimizing master data maturity for an enterprise master data architecture. The master data maturity analysis system generates a master data maturity matrix for individual master data users. Each unique master data user's master data maturity matrix is used to generate master data matrices for other hierarchical entities for an enterprise such as lines of business and/or the enterprise as a whole. Master data maturity matrices are stored over time and tracked to assess and optimize the master data maturity and improvement of the master data technology vertically and horizontally across all enterprise hierarchies and business components.


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