The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2021

Filed:

Nov. 20, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Shen Li, Yorktown Heights, NY (US);

Xiang Ni, Yorktown Heights, NY (US);

Michael John Witbrock, Ossining, NY (US);

Lingfei Wu, Croton on Hudson, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 40/40 (2020.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 40/40 (2020.01);
Abstract

A method and system of creating a model for large scale data analytics is provided. Training data is received in a form of a data matrix X and partitioned into a plurality of partitions. A random matrix T is generated. A feature matrix is determined based on multiplying the partitioned training data by the random matrix T. A predicted data {tilde over (y)} is determined for each partition via a stochastic average gradient (SAG) of each partition. A number of SAG values is reduced based on a number of rows n in the data matrix X. For each iteration, a sum of the reduced SAG values is determined, as well as a full gradient based on the sum of the reduced SAG values from all rows n, by distributed parallel processing. The model parameters w are updated based on the full gradient for each partition.


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