The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2021
Filed:
Feb. 03, 2017
Adxcel Inc., Pleasanton, CA (US);
Yuri Khidekel, Lafayette, CA (US);
Dmitry Aryshev, Sankt-Peterburg, RU;
Adxcel Inc., Pleasanton, CA (US);
Abstract
A method of machine learning includes performing dimensionality reduction on a parameter space by performing initial tests to determine scores for a plurality of parameter values in the parameter space, determining aggregate scores for a plurality of parameter value combinations, determining a ranking of the plurality of parameter value combinations based on the aggregate scores, and performing cluster analysis on the plurality of parameter value combinations to determine a set having highest aggregate scores. The method further includes performing additional tests, wherein each additional test is for a parameter value combination in the set. For each such parameter value combination, a probability of achieving a key performance indicator (KPI) is computed. Cluster analysis is then performed to determine a first subset of the set having highest probabilities of achieving the KPI. An operation is then performed on the first subset.