The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10997009 B1

PDF
Full Text
Expired
Date of Patent:
May. 04, 2021

Filed:

Dec. 10, 2018
Applicant:

Vmware, Inc, Palo Alto, CA (US);

Inventors:

Arnak Poghosyan, Yerevan, AM;

Ashot Nshan Harutyunyan, Yerevan, AM;

Naira Movses Grigoryan, Yerevan, AM;

Nicholas Kushmerick, Seattle, WA (US);

Assignee:

VMware, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0709 (2013.01); G06F 11/0751 (2013.01); G06N 20/00 (2019.01);
Abstract

The current document is directed to methods and systems for detecting the occurrences of abnormal events and operational behaviors within the distributed computer system. The currently described methods and systems continuously collect metric data from various metric-data sources, generate a sequence of metric-data observations, each metric-data observation comprising a set of temporally aligned metric data, and employ principle-component analysis to transform the metric-data observations to facilitate reduction of the dimensionality of the metric-data observations. The currently described methods and systems then employ clustering methods to identify outlying transformed-metric-data observations, accordingly label the transformed metric-data observations to generate a training dataset, and then apply one or more of various types of machine-learning techniques to the training dataset in order to generate an abnormal-observation detector that can be used to detect, in real time, abnormal metric-data observations as they are generated within the distributed computing system.


Find Patent Forward Citations

Loading…