The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2021

Filed:

May. 08, 2020
Applicant:

Trustees of Boston University, Boston, MA (US);

Inventors:

Luca Dal Negro, Boston, MA (US);

Yuyao Chen, Boston, MA (US);

Wesley Britton, Boston, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/18 (2006.01); G02B 1/11 (2015.01);
U.S. Cl.
CPC ...
G02B 5/1857 (2013.01); G02B 5/1814 (2013.01); G02B 5/1828 (2013.01); G02B 1/11 (2013.01);
Abstract

An optical element includes a substrate and a pattern. The substrate has a top surface and a bottom surface. The pattern is provided on the top surface. The pattern includes multiple levels such that a thickness of the pattern is less than a design wavelength. The pattern is configured to focus an incident radiation, received at one of the top surface or the bottom surface of the substrate, at one or more prescribed focal locations on a detection plane. The one or more prescribed focal locations on the detection plane changes in proportion to a wavelength of the incident radiation. The detection plane is an achromatic focal plane when the incident radiation includes multiple wavelengths.


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