The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2021
Filed:
May. 22, 2018
Anritsu Infivis Co., Ltd., Kanagawa, JP;
Yuki Hayakawa, Kanagawa, JP;
Eiji Taniguchi, Kanagawa, JP;
Akira Ohashi, Kanagawa, JP;
Tomohiko Yamaguchi, Kanagawa, JP;
ANRITSU INFIVIS CO., LTD., Kanagawa, JP;
Abstract
A metal detection apparatus comprises: a detection circuit unit () that detects a first variation component having a large influence of workpiece and a second variation component having a large influence of metal; a determination unit () that compares the two variation components to perform a metal determination process in the workpiece (W); and a detection condition adjustment unit () that adjusts detection conditions of both variation components. A foreign matter waveform storage unit () stores a test variation component accompanying temporal change due to metal influence is further provided. The detection condition adjustment unit sets a specific processing condition of detection processing in the detection circuit unit based on the first variation component based on the magnetic field variation signal at the time when the work W including no metal passes through the inspection zone Z and the second variation component constituted by the test variation component.