The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2021

Filed:

Aug. 22, 2018
Applicant:

General Electric Company, Schenectady, NY (US);

Inventor:

Ali Ersoz, Brookfield, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/385 (2006.01); G01R 33/54 (2006.01);
U.S. Cl.
CPC ...
G01R 33/3852 (2013.01); G01R 33/543 (2013.01);
Abstract

Methods and systems are provided for optimizing gradient waveforms for oblique imaging. In one embodiment, a method comprises generating initial gradient waveforms in logical axes, evaluating area demand of each of the initial gradient waveforms, increasing a maximum amplitude of the initial gradient waveform in a first logical axis, reducing a maximum amplitude of the initial gradient waveform in a second logical axis, wherein the area demand in the first logical axis is greater than the area demand in the second logical axis, converting the gradient waveforms to physical gradient waveforms, and driving physical amplifiers of an imaging system with the physical gradient waveforms during a scan. In this way, oblique scans may be performed without a performance reduction caused by increases in echo time, repetition time, and echo spacing.


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