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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10996282 B1

PDFFull Text
Date of Patent:
May. 04, 2021

Filed:

Mar. 14, 2019

Abnormality factor determination apparatus, degradation determination apparatus, computer program, degradation determining method, and abnormality factor determining method

Applicant:

Gs Yuasa International Ltd., Kyoto, JP;

Inventor:

Nan Ukumori, Kyoto, JP;

Assignee:

GS Yuasa International Ltd., Kyoto, JP;

Attorney:

Alston & Bird LLP

Primary Examiner:

Mohammad K Islam

Int. Cl.
CPC ...
G01R 31/392 (2019.01); G01R 31/3842 (2019.01); G06N 20/00 (2019.01); G01R 31/367 (2019.01); G01R 31/374 (2019.01); H01M 10/42 (2006.01); H01M 10/48 (2006.01); H02J 3/32 (2006.01); H02J 3/38 (2006.01);
U.S. Cl.
CPC ...
G01R 31/392 (2019.01); G01R 31/367 (2019.01); G01R 31/374 (2019.01); G01R 31/3842 (2019.01); G06N 20/00 (2019.01); H01M 10/4285 (2013.01); H01M 10/48 (2013.01); H02J 3/32 (2013.01); H02J 3/381 (2013.01);
Abstract

This abnormal factor determination device is provided with a measured value acquisition unit which acquires measured values including electric values and temperature values of multiple power storage elements, a predicted value acquisition unit which acquires predicted values including electric values and temperature values of multiple power storage elements, and a determination unit which, on the basis of the acquired measured values and predicted values, determines whether or not there are abnormal factors in the power storage system.

Find Patent Forward Citations

Ukumori, Nan. (2021). Abnormality factor determination apparatus, degradation determination apparatus, computer program, degradation determining method, and abnormality factor determining method (U.S. Patent No. 10996282). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10996282

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