The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2021
Filed:
Apr. 04, 2018
National Instruments Corporation, Austin, TX (US);
Kunal Patel, Houston, TX (US);
Tobias Gordon, Genoa Township, OH (US);
Laura Nayman, Austin, TX (US);
Marcos Kirsch, Austin, TX (US);
Reid Lee, Cedar Park, TX (US);
Tyler Healy, Austin, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
Methods and measurements systems are disclosed relating to dynamic measurement prioritization by multiple software interfaces. A first software interface with a low priority may be conducting a first measurement on a device under test (DUT) through a driver connected to a measurement device. A second software interface with a higher priority may initiate a request to conduct a second measurement on the DUT. In response, the driver may automatically determine that the second software interface has a higher priority than the first software interface and may halt the first measurement and conduct the second measurement. The driver may notify the first software interface that its access to the measurement hardware has been revoked, and the first software interface may enter a monitoring mode to monitor the results of the second measurement.