The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2021

Filed:

May. 07, 2020
Applicant:

Vertiv Corporation, Columbus, OH (US);

Inventor:

Kevin R. Ferguson, Dublin, OH (US);

Assignee:

Vertiv Corporation, Columbus, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/42 (2006.01); G01R 31/50 (2020.01); G01R 31/52 (2020.01); G01R 19/02 (2006.01); G01R 19/25 (2006.01); H02H 3/16 (2006.01); H02H 3/32 (2006.01); H02H 3/04 (2006.01); G06F 1/26 (2006.01); G01R 21/133 (2006.01);
U.S. Cl.
CPC ...
G01R 19/2513 (2013.01); G01R 19/02 (2013.01); G01R 19/2509 (2013.01); G01R 31/42 (2013.01); G01R 31/50 (2020.01); G06F 1/266 (2013.01); H02H 3/042 (2013.01); H02H 3/16 (2013.01); H02H 3/32 (2013.01); G01R 21/133 (2013.01); G06F 2200/261 (2013.01);
Abstract

A system and method is disclosed for detecting a specific voltage phase, from a multiphase voltage source, and a specific outlet of an intelligent power strip, that is associated with a residual current flow. The method accomplishes this by using a system that employs a statistical time series analysis using a Pearson's correlation coefficient calculation to measure the linear dependence between the discretely sampled residual current waveform and each phase and outlet's discretely sampled current waveforms, in turn. A residual current as low as 1 mA can be accurately measured and its associated voltage phase source, as well as which outlet of an intelligent power strip it flows out of, can be reliably determined.


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