The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2021

Filed:

May. 11, 2017
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Manabu Kusumoto, Tokyo, JP;

Katsumi Kikuchi, Tokyo, JP;

Takahiro Kumura, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/44 (2006.01); F17D 5/00 (2006.01); G01F 1/66 (2006.01); G01N 29/14 (2006.01); G01N 29/46 (2006.01); G01N 29/07 (2006.01); G01N 29/04 (2006.01);
U.S. Cl.
CPC ...
G01N 29/4472 (2013.01); F17D 5/00 (2013.01); G01F 1/666 (2013.01); G01N 29/043 (2013.01); G01N 29/07 (2013.01); G01N 29/14 (2013.01); G01N 29/46 (2013.01); G01N 2291/0258 (2013.01); G01N 2291/02854 (2013.01); G01N 2291/262 (2013.01); G01N 2291/2634 (2013.01);
Abstract

To acquire information relating to degradation of a pipe on the basis of information that can be acquired using a simple method. The analysis device according to one embodiment is provided with: a determining unit for determining whether or not the accuracy of a pipe network model based on information that includes a parameter that changes in value in accordance with degradation of a pipe satisfies a predetermined criterion; and a derivation unit for deriving information relating to degradation of the pipe, based on the parameter, if the accuracy satisfies the predetermined criterion.


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