The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2021
Filed:
May. 17, 2018
U.s.a. As Represented BY the Administrator of Nasa, Washington, DC (US);
Tamer Refaat, Hampton, VA (US);
Mulugeta Petros, Newport News, VA (US);
Upendra N. Singh, Yorktown, VA (US);
UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA, Washington, DC (US);
Abstract
Systems, methods, and devices of the various embodiments may provide a fast and precise methods for continuously monitoring and measuring the absolute wavelength of monochromatic radiation sources, such as lasers, etc., irrespective of the temporal profile of the source (i.e., continuous wave, modulated, or pulsed). Radiation power measurement may also be enabled by the various embodiment methods. The various embodiment methods may utilize high-speed low-noise detection to enable fast and accurate measurements. High-precision wavelength and power measurement may be achieved in the various embodiments to monitor radiation source jitters and fluctuations, without relying on frequency transforms or dispersive optics. Both wavelength and power may be measured simultaneously or sequentially in various embodiments.