The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10996096 B1

PDF
Full Text
Expired
Date of Patent:
May. 04, 2021

Filed:

Jun. 10, 2019
Applicant:

Vega Grieshaber KG, Wolfach, DE;

Inventors:

Juergen Skowaisa, Schiltach, DE;

Clemens Hengstler, Haslach, DE;

Assignee:

VEGA GRIESHABER KG, Wolfach, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 23/284 (2006.01); G01S 13/10 (2006.01); G01S 13/88 (2006.01); H01Q 1/42 (2006.01); G01S 7/06 (2006.01);
U.S. Cl.
CPC ...
G01F 23/284 (2013.01); G01S 7/062 (2013.01); G01S 13/10 (2013.01); G01S 13/88 (2013.01); H01Q 1/422 (2013.01);
Abstract

The invention is a measuring arrangement for measuring a fill level in a container with a radar level gauge according to the delay principle, which comprises an adaptation for reducing electromagnetic radiation reflected by the surfaces of the wall of the container as well as a method for optimizing the adaptation and for reducing stray radiation, for example radiation reflected by the container walls, with here display devices indicating if stray radiation is sufficiently reduced.


Find Patent Forward Citations

Skowaisa, Juergen. (2021). Arrangement for determining and displaying the optimal material thickness when measuring fill levels using radar sensors (U.S. Patent No. 10996096). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10996096

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