The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 04, 2021

Filed:

Jun. 26, 2020
Applicant:

Nichia Corporation, Anan, JP;

Inventors:

Takanori Aruga, Suwa-gun, JP;

Hiroyuki Itahana, Okaya, JP;

Wataru Kitahara, Kamiina-gun, JP;

Yoshinori Momose, Matsumoto, JP;

Masahiro Imai, Chino, JP;

Assignee:

NICHIA CORPORATION, Anan, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F21V 7/00 (2006.01); F21Y 115/10 (2016.01);
U.S. Cl.
CPC ...
F21V 7/0091 (2013.01); F21V 7/0033 (2013.01); F21Y 2115/10 (2016.08);
Abstract

An optical device includes: a first reflective surface disposed to reflect, to a substantially arc-shaped first region around a first axis, at least a portion of first light incident along the first axis and having a light distribution characteristic with an optical axis parallel to the first axis, the first reflective surface including a plurality of reflective arc surfaces separated in a direction along the first axis; a second reflective surface and a third reflective surface intersecting each other on the first axis and disposed such that the first reflective surface is located between the second reflective surface and the third reflective surface; and a light-transmissive emission surface adapted to refract at least a portion of light reflected by the plurality of reflective arc surfaces to emit the light around the first axis, the emission surface having periodic irregularities in a cross section in the direction along the first axis.


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