The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2021
Filed:
Apr. 29, 2020
In-situ measurement of the delay between the envelope and the rf signal in envelope-tracking systems
Applicant:
Qualcomm Incorporated, San Diego, CA (US);
Inventors:
Chirag Sthalekar, Burlington, MA (US);
Leon Metreaud, Pepperell, MA (US);
Hakan Inanoglu, Acton, MA (US);
Xiangdong Zhang, Westford, MA (US);
Assignee:
QUALCOMM Incorporated, San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/50 (2006.01); H03M 1/18 (2006.01); G04F 10/10 (2006.01); G04F 10/00 (2006.01);
U.S. Cl.
CPC ...
H03M 1/502 (2013.01); G04F 10/005 (2013.01); G04F 10/105 (2013.01); H03M 1/18 (2013.01);
Abstract
An in-situ delay measurement is performed for an envelope-tracking power amplifier of an RF input signal. Because the delay measurement is in-situ, the delay measurement avoids the necessity to down convert and digitize a version of an RF output signal from the envelope-tracking power amplifier.