The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2021

Filed:

Sep. 11, 2018
Applicant:

Lg Chem, Ltd., Seoul, KR;

Inventors:

Yongjin Bae, Daejeon, KR;

Jong Chan Kim, Daejeon, KR;

Yeu Young Youn, Daejeon, KR;

Young Hee Lim, Daejeon, KR;

Hye Sung Cho, Daejeon, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/04 (2006.01); H01J 49/00 (2006.01); H01J 49/16 (2006.01); H01J 49/40 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0418 (2013.01); H01J 49/0031 (2013.01); H01J 49/0404 (2013.01); H01J 49/164 (2013.01); H01J 49/40 (2013.01);
Abstract

The present invention provides a method enabling a quantitative analysis of a polymer by MALDI mass spectrometry, and a method for manufacturing a sample for MALDI mass spectrometry for a quantitative analysis of a polymer. To that end, the methods can increase reproducibility of a MALDI spectrum by making uniform the thickness of a sample affecting the pattern in a polymer MALDI spectrum. The sample according to the present invention is applicable also to a commercial MALDI-TOF instrument, and, thus, can quantitatively analyze a polymer in a more efficient and faster manner.


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