The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2021

Filed:

Oct. 11, 2019
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Yong Ju Cho, Daejeon, KR;

Jeong Il Seo, Daejeon, KR;

Soon Heung Jung, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H04N 13/02 (2006.01); G06T 3/40 (2006.01); G06T 3/00 (2006.01); G06T 5/00 (2006.01); G06T 5/50 (2006.01); H04N 5/232 (2006.01); H04N 5/247 (2006.01); G06T 5/40 (2006.01);
U.S. Cl.
CPC ...
G06T 3/4038 (2013.01); G06T 3/0093 (2013.01); G06T 5/006 (2013.01); G06T 5/40 (2013.01); G06T 5/50 (2013.01); H04N 5/23238 (2013.01); H04N 5/247 (2013.01); G06T 2207/20021 (2013.01);
Abstract

The present invention relates to an apparatus and a method of stitching a real-time image. More specifically, stitching-related information is generated, a parallax occurrence region in an overlap region is tracked, and correction for reducing parallax occurring in the parallax occurrence region and correction of an image distortion occurring in a non-overlap region are performed for output.


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