The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2021

Filed:

Nov. 09, 2017
Applicant:

Accenture Global Solutions Limited, Dublin, IE;

Inventors:

Abhilash Alexander Miranda, Dublin, IE;

Laura Alvarez, Dublin, IE;

Medb Corcoran, Dublin, IE;

Edward Burgin, Nottingham, GB;

Kristine Marie Renker, Grand Rapids, MI (US);

Kris Timmermans, Everberg, BE;

Kimberly De Maeseneer, Knokke-Heist, BE;

Amaury Reychler, Woluwé-Saint-Lambert, BE;

Shinichiro Shuda, El Segundo, CA (US);

Robert Willems, Miami, FL (US);

Laura O'Malley, Dublin, IE;

Urvesh Bhowan, Bray Wicklow, IE;

Pedro Sacristan, Dublin, IE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/10 (2019.01); G06N 20/00 (2019.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
G06N 20/10 (2019.01); G06N 20/00 (2019.01); G06N 5/022 (2013.01);
Abstract

A self-learning system for categorizing log entries may be provided. The system may display a first log entry and receive a categorical identifier for the first log entry. The system may parse the first log entry for predetermined text information and predetermined image information. The predetermined text information may be included in a datafield classifier and the predetermined image information included in a metadata classifier. The system may identify the predetermined text information in the log entry and adjust a first prioritization of respective categorical identifiers included in the datafield classifier. The system may identify the predetermined image information in the first log entry and adjust a second prioritization of the respective categorical identifiers included in the metadata classifier. The system may map a second log entry to the categorical identifier based on adjustment of the first prioritization or adjustment of the second prioritization.


Find Patent Forward Citations

Loading…