The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2021

Filed:

Jun. 13, 2019
Applicant:

Baidu Usa Llc, Sunnyvale, CA (US);

Inventors:

Yunhan Jia, Sunnyvale, CA (US);

Zhenyu Zhong, Sunnyvale, CA (US);

Yulong Zhang, Sunnyvale, CA (US);

Tao Wei, Sunnyvale, CA (US);

Assignee:

BAIDU USA LLC, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G05D 1/02 (2020.01); G05D 1/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6265 (2013.01); G05D 1/0088 (2013.01); G05D 1/0251 (2013.01); G06K 9/00671 (2013.01); G06K 9/00791 (2013.01); G06K 9/6268 (2013.01); G05D 1/0238 (2013.01); G05D 2201/0213 (2013.01); G06K 2209/27 (2013.01);
Abstract

In one embodiment, a system receives a first image captured by a capturing device of an ADV. The system applies an image transformation to the first image to generate a second image. The system applies an object detection model to the first and the second images to generate a first and a second output, respectively. The system calculates a similarity metric between the first and the second output. The system detects the first image as an adversarial sample if a temporal variation of the similarity metric between the first image and a prior image is above a threshold.


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