The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2021

Filed:

Jan. 31, 2019
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Steven Pham, San Francisco, CA (US);

John C. Moon, San Jose, CA (US);

Yumo Liu, Sunnyvale, CA (US);

Ruixuan Hou, Sunnyvale, CA (US);

Fenghuan Lu, Sunnyvale, CA (US);

David Q. He, Cupertino, CA (US);

Assignee:

Microsoft Technology Licensing, LLC, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/2455 (2019.01); G06F 16/28 (2019.01); G06F 16/2453 (2019.01); G06F 16/2458 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24556 (2019.01); G06F 16/2462 (2019.01); G06F 16/24545 (2019.01); G06F 16/283 (2019.01); G06F 16/24535 (2019.01);
Abstract

The disclosed embodiments provide a system for processing data. During operation, the system obtains a set of partitions containing records spanning a time interval, wherein the records include a set of values for a metric and a set of dimensions associated with the set of values. For each dimensional subset associated with the set of dimensions, the system aggregates, based on the set of partitions, a corresponding subset of values for the metric into a distribution-based representation of the metric. The system then stores a dictionary encoding of the dimensional subset in association with the distribution-based representation of the metric. Finally, the system calculates, based on the distribution-based representation, one or more quantiles associated with the dimensional subset and outputs the quantile(s) for use in characterizing a distribution of the metric.


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