The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2021

Filed:

May. 18, 2018
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Shin-Young Ahn, Daejeon, KR;

Eun-Ji Lim, Daejeon, KR;

Yong-Seok Choi, Daejeon, KR;

Young-Choon Woo, Daejeon, KR;

Wan Choi, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); G06F 15/173 (2006.01); G06N 3/08 (2006.01); H04L 29/08 (2006.01); G06F 9/50 (2006.01);
U.S. Cl.
CPC ...
G06F 15/17331 (2013.01); G06F 9/50 (2013.01); G06N 3/08 (2013.01); H04L 67/10 (2013.01);
Abstract

Disclosed herein are a parameter server and a method for sharing distributed deep-learning parameters using the parameter server. The method for sharing distributed deep-learning parameters using the parameter server includes initializing a global weight parameter in response to an initialization request by a master process; performing an update by receiving a learned local gradient parameter from the worker process, which performs deep-learning training after updating a local weight parameter using the global weight parameter; accumulating the gradient parameters in response to a request by the master process; and performing an update by receiving the global weight parameter from the master process that calculates the global weight parameter using the accumulated gradient parameters of the one or more worker processes.


Find Patent Forward Citations

Loading…