The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2021

Filed:

Jun. 13, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Andrew Hicks, Wappingers Falls, NY (US);

Dale E. Blue, Poughkeepsie, NY (US);

Ryan Rawlins, New Paltz, NY (US);

Steven Partlow, Beacon, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3664 (2013.01); G06F 11/3676 (2013.01); G06F 11/3688 (2013.01);
Abstract

Systems, methods, and computer-readable media are described for associating regression test cases with corresponding test fingerprints via a translation table or other suitable storage mechanism. A test fingerprint indicates a collection of breakpoints encountered as part of traversal of a code path during execution of a test case, and thus, provides an indication of an extent of code coverage of the test case. Test fingerprints can be evaluated to determine cumulative code coverage of sets of test cases. Specific sets of test cases can be selected based on the cumulative code coverage they provide. Sets of test cases that provide greater cumulative code coverage and/or that target specific areas of interest can be prioritized for execution particularly when having to adhere to execution constraints.


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